Characterizing the wetting of metallic thin films with angle-resolved photoelectron spectroscopy
نویسندگان
چکیده
The wetting of thin Ag films on Cu 111 is characterized in detail with angle-resolved photoelectron spectroscopy. After constructing disordered Ag films on Cu 111 , we monitored the evolution of their layer-resolved Shockley states during wetting. Our results provide the first observation of a transitional state, which implies a coexistence of clean Cu 111 , 1 ML of Ag on Cu 111 , and 2 ML of Ag on Cu 111 . The evolution of these Shockley states indicates a two-process model of wetting.
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